The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10140287 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 27, 2018

Filed:

Sep. 09, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gargi Banerjee Dasgupta, Bangalore, IN;

Atri Mandal, Bangalore, IN;

Animesh Nandi, Bangalore, IN;

Anindya Neogi, Bangalore, IN;

Sriram Raghavan, Chennai, IN;

Suriya Subramanian, Chennai, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/27 (2006.01); G06F 11/30 (2006.01); G06F 17/24 (2006.01);
U.S. Cl.
CPC ...
G06F 17/2785 (2013.01); G06F 11/30 (2013.01); G06F 17/248 (2013.01); G06F 17/30705 (2013.01);
Abstract

Methods and arrangements for efficiently mining a control flow graph from execution logs of a distributed system. Using at least one text clustering technique, two text clusters are generated from the plurality of execution logs. At least one approximate template is generated based on the at least two text clusters. At least one refined template is created via refining the at least one approximate template using multimodal sequencing. The control flow graph is created based on the at least one refined template. An anomaly is detected in the control flow graph.


Find Patent Forward Citations

Dasgupta, Gargi. (2018). Scalable and accurate mining of control flow from execution logs across distributed systems (U.S. Patent No. 10140287). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10140287

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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