The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Jul. 22, 2015
Fisher-rosemount Systems, Inc., Round Rock, TX (US);
Terrence L. Blevins, Round Rock, TX (US);
Wilhelm K. Wojsznis, Austin, TX (US);
Mark J. Nixon, Round Rock, TX (US);
John M. Caldwell, Austin, TX (US);
FISHER-ROSEMOUNT SYSTEMS, INC., Round Rock, TX (US);
Abstract
A process modeling technique uses a single statistical model, such as a PLS, PRC, MLR, etc. model, developed from historical data for a typical process and uses this model to perform quality prediction or fault detection for various different process states of a process. The modeling technique determines means (and possibly standard deviations) of process parameters for each of a set of product grades, throughputs, etc., compares on-line process parameter measurements to these means and uses these comparisons in a single process model to perform quality prediction or fault detection across the various states of the process. Because only the means and standard deviations of the process parameters of the process model are updated, a single process model can be used to perform quality prediction or fault detection while the process is operating in any of the defined process stages or states. Moreover, the sensitivity (robustness) of the process model may be manually or automatically adjusted for each process parameter to tune or adapt the model over time.