The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Apr. 14, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Girish B. Chafle, New Dehli, IN;

Fan Jing Meng, Beijing, CN;

Jing Min Xu, Beijing, CN;

Lin Y Yang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0781 (2013.01); G06F 11/0778 (2013.01); G06F 17/30303 (2013.01); G06F 17/30368 (2013.01); G06F 17/30377 (2013.01);
Abstract

The scope of the system changes to be considered for analysis for finding problematic changes is reduced in order to allow focusing on highly potential suspicious drifts caused by change sequences. The method and system includes a data cleaning module to remove irrelevant changes, a feature extraction and normalization module to extract the features of change objects, data annotation module to remove irrelevant changes based on patterns, and a clustering module to obtain groups for further analysis. Data cleaning is simplified using domain independent rules. Additional sources of change sequences are removed by application of pattern based techniques so as to narrow down problematic system changes to analyze for root cause analysis. Change error sequence and degree of temporal correlation to correlate system changes with errors, as well as change behavior patterns may be used for downsizing the diagnosis scope.


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