The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Nov. 26, 2013
Apple Inc., Cupertino, CA (US);
Christopher J. Butler, Cupertino, CA (US);
Martin P. Grunthaner, Cupertino, CA (US);
Peter W. Richards, San Francisco, CA (US);
Romain A. Teil, Cupertino, CA (US);
Sinan Filiz, Cupertino, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A method of calibrating a force sensor that includes an input surface and an array of sensing elements. The input has a number of test locations and is deformable under applied force. The force sensor is mounted in a predetermined test orientation. For each test location of the plurality of test locations on the input surface of the force sensor a predetermined test force to the test location. An element calibration value is measured for each sensing element of the array of sensing elements of the force sensor. An (x, y) deformation map of the input surface of the force sensor corresponding to the application of the predetermined test force to the test location is determined based on the measured element calibration values.