The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Sep. 16, 2014
Applicants:

Wooseong Cheong, Suwon-si, KR;

Dae-ho Kim, Hwaseong-si, KR;

Changhoon Han, Hwaseong-si, KR;

Daehyun Kim, Seongnam-si, KR;

Jaechun Park, Seongnam-si, KR;

Inventors:

Wooseong Cheong, Suwon-si, KR;

Dae-Ho Kim, Hwaseong-si, KR;

Changhoon Han, Hwaseong-si, KR;

Daehyun Kim, Seongnam-si, KR;

Jaechun Park, Seongnam-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/32 (2006.01); G06F 1/26 (2006.01);
U.S. Cl.
CPC ...
G06F 1/266 (2013.01); G06F 1/3287 (2013.01); Y02D 10/171 (2018.01); Y02D 50/20 (2018.01);
Abstract

A non-signal analyzing method for a data storage system including a storage device connected to a host via a data line and a power line includes; communicating a non-signal from the host to the storage device via the power line, detecting the non-signal in the storage device and return the non-signal through to the host via the data line, and analyzing the returned non-signal using a protocol analyzer to generate analysis results characterizing the returned non-signal.


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