The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Mar. 15, 2016
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Manas Dutta, Bangalore, IN;

Praveen Shetty, Bangalore, IN;

Ramesh Babu Koniki, Bangalore, IN;

Praveen Gurrapu, Hyderabad, IN;

Mahesh Kumar Gellaboina, Kurnool, IN;

Sreedhara Mallavarpu, Bangalore, IN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G06F 15/18 (2006.01); G05B 13/04 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 13/048 (2013.01); G05B 23/0229 (2013.01);
Abstract

An apparatus includes a memory and one or more processors operably connected to the memory. The one or more processors are configured to receive data collected from a process facility system, detect anomalies for field device or process failures associated with the process facility system that are not monitored by alarms, detect leading indicators for field device or process failures that are monitored by alarms, and monitor the process facility system to detect further anomalies and leading indicators before failures occur.


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