The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Apr. 14, 2016
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Hefei Boe Optoelectronics Technology Co., Ltd., Anhui, CN;

Inventors:

Yangkun Jing, Beijing, CN;

Changjun Jiang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01); G06T 7/00 (2017.01); G01N 23/18 (2018.01);
U.S. Cl.
CPC ...
G02F 1/13 (2013.01); G01N 23/18 (2013.01); G06T 7/0006 (2013.01); G01N 2223/611 (2013.01); G01N 2223/646 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30121 (2013.01);
Abstract

The present disclosure provides in some embodiments an alignment film detecting device including: an imaging unit configured to obtain image information of the alignment grooves on the alignment film of the substrate; and an image processing unit configured to determine whether there is a defect in the alignment grooves on the alignment film based on the image information. According to the alignment film detecting device and the alignment film detecting method provided the present disclosure, the defect of the alignment film on the substrate may be detected, and the image information of the alignment grooves on the alignment film of the substrate may be obtained by the imaging unit, and a recognizing process may be implemented by the image processing unit based on the image information, so that it may accurately determine whether there is a defect in the alignment grooves. As compared with a method of manually detecting the defect in the alignment grooves by vapor in a conventional alignment film detecting technique, it may overcome disadvantages of manually detecting the defect in the alignment grooves of the substrate, such as low recognition rate, being vulnerable to false detection, and inefficient detection, so as to improve detection efficiency as well as accuracy and credibility of the detection result.


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