The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Jul. 20, 2018
The United States of America, As Represented BY the Secretary of the Navy, Washington, DC (US);
Brett J Hamilton, Heltonville, IN (US);
David S Stoker, Belmont, CA (US);
The United States of America, as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.