The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Sep. 06, 2017
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Kazuyoshi Okada, Saitama, JP;

Takashi Kunugise, Saitama, JP;

Yasunobu Kishine, Saitama, JP;

Michio Cho, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/10 (2006.01); G02B 9/64 (2006.01); G02B 13/04 (2006.01);
U.S. Cl.
CPC ...
G02B 7/10 (2013.01); G02B 9/64 (2013.01); G02B 13/04 (2013.01);
Abstract

The imaging lens includes a first lens group fixed during focusing and a positive second lens group moving to an object side during focusing from a long-distance object to a short-distance object, in order from a side closest to the object. The field curvature is adjusted by moving the first lens group or a sub-lens group within the first lens group including a lens closest to the object side, as an adjustment group. A stop fixed during the adjustment of the field curvature is disposed closer to an image side than the adjustment group. Conditional expressions relating to the focal length of the whole system, the focal length of the adjustment group, and the height of a paraxial on-axis light ray in the adjustment group are satisfied.


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