The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Dec. 19, 2014
Applicants:

Fei Le, Houston, TX (US);

Gregory B. Itskovich, Houston, TX (US);

Marina N. Nikitenko, Novosibirsk, RU;

Inventors:

Fei Le, Houston, TX (US);

Gregory B. Itskovich, Houston, TX (US);

Marina N. Nikitenko, Novosibirsk, RU;

Assignee:

BAKER HUGES, A GE COMPANY LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); G01V 3/28 (2006.01); G01V 3/24 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); G01V 3/24 (2013.01); G01V 3/28 (2013.01);
Abstract

A method for imaging an earth formation includes estimating an apparent resistivity (AR) value and an apparent distance to a bedding plane (AD2B) value for each of a plurality of samples derived from measurements of a time-dependent transient electromagnetic signal, estimating an inversion-based resistivity value (IB-R) and an inversion-based distance to a bedding plane (IB-D2B) value at a first sample of each consecutive depth interval, wherein each depth interval includes a plurality of consecutive samples, and determining a difference between apparent values and the corresponding inversion-based values. The method further includes generating an image of the earth formation using the AR and AD2B values for the entire interval if the difference is less than a threshold value and generating an image of the earth formation using IB-R and IB-D2B values for the entire interval if the difference is greater than the threshold value.


Find Patent Forward Citations

Loading…