The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

May. 21, 2014
Applicant:

Dürr Dental Ag, Bietigheim-Bissingen, DE;

Inventors:

Bernd Philipps, Untergruppenbach, DE;

Michael Weber, Burgstetten, DE;

Alexander Hack, Biberach, DE;

Assignee:

Dürr Dental AG, Bietigheim-Bissingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G01T 1/20 (2006.01); G03B 42/08 (2006.01); G02B 26/10 (2006.01); G02B 27/02 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2014 (2013.01); G01T 1/2016 (2013.01); G02B 26/101 (2013.01); G02B 27/026 (2013.01); G03B 42/08 (2013.01);
Abstract

A device configured to read an exposed imaging plate, comprises a light-source that generates read-out light. A deflection unit directs the read-out light in a scanning movement over the imaging plate. The deflection unit comprises a micromirror that deflects impinging read-out light towards the imaging plate. The micromirror swivels about a first swivel axis and about a different second swivel axis. The micromirror oscillates with a first frequency about the first swivel axis and simultaneously with a different second frequency about the second swivel axis. A detector unit detects fluorescent light which is emitted from the imaging plate at locations where the read-out light impinges.


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