The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Mar. 30, 2017
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Hans Weber, Menlo Park, CA (US);
Brian A. Hargreaves, Menlo Park, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
A method using 2D multi-spectral imaging (2DMSI) for MRI imaging of a metallic object (such as a biopsy needle) and region surrounding the metallic object within an imaging field of view of an MRI apparatus includes segmenting the imaging field-of-view into spatial-spectral bins, where the segmenting is based on off-resonance frequency induced by the metallic object and slice location; selectively exciting each frequency bin of the spatial-spectral bins by inverting a slice selection gradient between excitation and refocusing pulses; performing repeated acquisition with different radiofrequency modulations to produce acquired images of adjacent bins; composing a 2DMSI image by root-sum-of-squares combination of the acquired images of adjacent bins; and highlighting in the 2DMSI image an area of furthest off-resonance bins based on 2DMSI off-resonance information by thresholding image intensity in frequency bins, thereby indicating a contour of the metallic object.