The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Jul. 20, 2015
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, Anhui, CN;

Inventors:

Qian Li, Beijing, CN;

Xiaolei Wang, Beijing, CN;

Daowu Huang, Beijing, CN;

Sheng Du, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01P 5/02 (2006.01); G01P 13/00 (2006.01); G01N 15/06 (2006.01); G01P 13/04 (2006.01); G01P 5/00 (2006.01);
U.S. Cl.
CPC ...
G01P 13/045 (2013.01); G01P 5/001 (2013.01);
Abstract

The present invention provides an airflow test method comprising: setting a plurality of test points within a test space; detecting the respective one-dimensional velocities of the airflow at each test point along a plurality of test directions, said plurality of test directions including at least three directions; calculating the actual direction and the actual velocity of the airflow at each test point based on the respective one-dimensional velocities of the airflow at the test point along the plurality of test directions. Also, the present invention provides an airflow test apparatus and a clean room control system. The present invention enables detecting the distribution of airflow in the test space with simple method.


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