The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Mar. 26, 2012
Applicants:

Henricus Josephus Cornelus Maria Sterenborg, Capelle aan den ljssel, NL;

Stephen Chad Kanick, Wheeling, WV (US);

Arjen Amelink, Gouda, NL;

Dominic James Robinson, Rotterdam, NL;

Inventors:

Henricus Josephus Cornelus Maria Sterenborg, Capelle aan den ljssel, NL;

Stephen Chad Kanick, Wheeling, WV (US);

Arjen Amelink, Gouda, NL;

Dominic James Robinson, Rotterdam, NL;

Assignee:

QUASPEC B.V., Zevenhuizen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/49 (2006.01); G01N 33/26 (2006.01); A61B 5/00 (2006.01); G01N 21/47 (2006.01); G01N 21/27 (2006.01); A61B 5/02 (2006.01);
U.S. Cl.
CPC ...
G01N 33/26 (2013.01); A61B 5/0075 (2013.01); G01N 21/274 (2013.01); G01N 21/474 (2013.01); G01N 21/49 (2013.01); A61B 5/02007 (2013.01); A61B 2560/0233 (2013.01);
Abstract

The invention relates to a method to determine the wavelength dependent absorption coefficient of a turbid medium using overlapping illumination-detection areas comprising the steps of a) retrieving a calibration spectrum (CA) from a reference measurement using a reference sample; b) carrying out a measurement on an actual sample for determining the absolute reflection spectrum (R) using a raw spectrum measured on the sample (S) and the calibration spectrum (C); C) using the absolute reflection spectrum (R) for determining the wavelength dependent absorption coefficient by minimizing the difference between the measured absolute reflection spectrum (R) and a model function (R). wherein the model function (R) is modelled using a predetermined equation based on prior knowledge of the combination of a dependence of the effective photon path length (L) on a scattering phase function (PF); a dependence of the absolute reflectance in the absence of absorption (R) on scattering phase function (PF). The invention further relates to a system and a computer program product for determining the wavelength dependent absorption coefficient of a turbid medium.


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