The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Jan. 14, 2015
Volume Graphics Gmbh, Heidelberg, DE;
Thomas Günter, Heidelberg, DE;
Christoph Poliwoda, Mannheim, DE;
Christof Reinhart, Heidelberg, DE;
Tobias Dierig, Heidelberg, DE;
VOLUME GRAPHICS GMBH, Heidelberg, DE;
Abstract
An apparatus for examining components comprising laid fiber composite fabrics or woven fiber composite fabrics which comprise a number of thin plies with in part different alignment, comprises a measuring device for carrying out a non-destructive measurement to collect volumetric data of the component and comprising an evaluation device for evaluating the collected data of the component, wherein the evaluation by the evaluation device comprises selecting a first analysis region in the collected data of the component, determining a local coordinate system of the first analysis region, successively establishing local material properties layer-by-layer at predetermined distances in a direction perpendicular to the lateral extent of the first analysis region, detecting ply boundaries along the established material properties, and averaging the local material properties in each detected ply.