The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Feb. 24, 2015
Applicant:

Horiba Jobin Yvon Sas, Longjumeau, FR;

Inventors:

Bertrand Dutertre, Wattrelos, FR;

Denis Cattelan, Antony, FR;

Emmanuel Fretel, Croix, FR;

Assignee:

HORIBA JOBIN YVON SAS, Longjumeau, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01J 3/02 (2006.01); G02B 27/00 (2006.01); G02B 21/00 (2006.01); G01J 3/44 (2006.01); G02B 21/02 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/0205 (2013.01); G01J 3/44 (2013.01); G02B 21/0048 (2013.01); G02B 21/0064 (2013.01); G02B 21/0076 (2013.01); G02B 21/02 (2013.01); G02B 21/16 (2013.01); G02B 27/0025 (2013.01); G01N 2021/656 (2013.01); G01N 2201/063 (2013.01); G01N 2201/068 (2013.01); G01N 2201/06113 (2013.01);
Abstract

An optical apparatus for Raman scattering microscopy includes a laser source that emits a laser beam at an excitation wavelength λ, a microscope objective that receives the laser beam and focuses the laser beam in an image plane of the microscope objective, the focused laser beam being intended to illuminate a sample, an optical system for collecting a Raman scattering optical beam, and detection elements suitable for detecting the Raman scattering beam collected. More particularly, the Raman scattering microscopy apparatus further includes an adaptive optics system positioned on an optical path of the Raman scattering beam, the said adaptive optics system is configured to form the image of an energy distribution inside the confocal hole on the entrance slit of the spectrometer in such a way as to obtain an energy distribution in a direction of a height of the slit.


Find Patent Forward Citations

Loading…