The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Jun. 28, 2016
Applicants:
Hannu Harjunmaa, Holden, MA (US);
Sinikka Harjunmaa, Holden, MA (US);
Inventors:
Hannu Harjunmaa, Holden, MA (US);
Sinikka Harjunmaa, Holden, MA (US);
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); C12G 1/00 (2006.01); G01B 11/06 (2006.01); G01N 33/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4133 (2013.01); C12G 1/00 (2013.01); G01B 11/06 (2013.01); G01B 11/0633 (2013.01); G01N 21/41 (2013.01); G01N 33/143 (2013.01); G01N 33/146 (2013.01); G01N 33/14 (2013.01); G01N 2201/06113 (2013.01);
Abstract
The present invention pertains to the measurement of the refractive index of a medium, such as a fluid, through the wall of its container. The essential characteristic of the invention is that, by using at least two separate light paths that are of unequal length and that reflect from the wall/medium interface, it is possible to perform the measurement of the refractive index of the medium so that the result is insensitive to the color and thickness of the wall.