The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Oct. 16, 2017
Applicant:
Kaiser Optical Systems Inc., Ann Arbor, MI (US);
Inventor:
Harry Owen, Franklin, MI (US);
Assignee:
Kaiser Optical Systems Inc., Ann Arbor, MI (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01N 21/65 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 15/1434 (2013.01); G01N 21/65 (2013.01); G01N 21/8507 (2013.01); G01N 2015/1486 (2013.01);
Abstract
The present disclosure is directed to a method of particle size determination for particles suspended within a light-transmissive medium. The method includes directing a monochromatic light source into the medium and collecting from the medium a Raman-scattered light spectrum. The method includes analyzing the Raman spectrum to determine an amount of Tyndall scattering of the Raman spectrum caused by particles within the medium, and thus determine the size and the number of particles mediating the Tyndall scattering.