The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Aug. 24, 2015
Applicant:

Korea Basic Science Institute, Yuseong-gu, Daejeon, KR;

Inventors:

Ki Soo Chang, Daejeon, KR;

Dong Uk Kim, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/10 (2006.01); G06K 9/46 (2006.01); G06K 9/74 (2006.01); H04N 5/33 (2006.01); H04N 5/349 (2011.01); H04N 5/355 (2011.01); H04N 5/365 (2011.01); G01K 11/12 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01J 5/10 (2013.01); G01K 11/125 (2013.01); G06K 9/4661 (2013.01); G06K 9/741 (2013.01); H04N 5/33 (2013.01); H04N 5/349 (2013.01); H04N 5/3559 (2013.01); H04N 5/3655 (2013.01); G01J 2005/0077 (2013.01); G01K 2213/00 (2013.01);
Abstract

Disclosed is a temperature distribution measuring device for measuring the temperature distribution or the heat generation distribution in a sample. An embodiment collects a reflection signal the reflectivity of which changes on the basis of a bias signal applied to a sample, detects a signal of interest, which has been reflected from a region of interest in the sample, from the reflected signal, converts the signal of interest to a frequency range signal, calculates the relative amount of change in reflectivity of the sample by using a direct current component extracted on the basis of filtering of the frequency range signal and a frequency component of the bias signal, and acquires a thermal image of the sample on the basis of the relative amount of change in reflectivity.


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