The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Mar. 28, 2017
Applicant:
Fluke Corporation, Everett, WA (US);
Inventors:
J. David Schell, Austin, TX (US);
Seymour Goldstein, Austin, TX (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01);
Abstract
An optical measurement device and loss measurement is provided. The optical measurement device receives one or more optical signals that respectively emanate from one or more optical fibers of a plurality of optical fibers of an optical fiber cable. The optical measurement device captures one or more images of the one or more optical signals and determines, based on the one or more images, one or more receiving positions of the one or more optical signals, respectively.