The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Dec. 09, 2016
Applicant:

Astrodesign, Inc., Tokyo, JP;

Inventors:

Toshiharu Takesue, Tokyo, JP;

Shigeto Takeda, Tokyo, JP;

Nobuyuki Nishizawa, Tokyo, JP;

Tatsuho Arima, Tokyo, JP;

Shigeaki Suzuki, Tokyo, JP;

Assignee:

ASTRODESIGN, INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01B 11/24 (2006.01); G01B 11/245 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/245 (2013.01); G02B 21/0096 (2013.01);
Abstract

An optical distance measuring apparatus includes: a scanning element scanning a coherent irradiation light from a light source and sending it to an object under measurement; a photo detector receiving the irradiation light modulated by being passed through the object under measurement in accordance with the scanning, and performing photoelectric conversion on the irradiation light; and a measuring unit obtaining phase information of the object under measurement based on a signal photoelectrically converted by the photo detector and a signal to be a reference for the scanning by the scanning element, and obtaining a measurement value regarding the object under measurement based on the phase information.


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