The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Mar. 02, 2017
Applicant:

Ngk Insulators, Ltd., Nagoya, JP;

Inventors:

Kiyoshi Matsushima, Nagoya, JP;

Morimichi Watanabe, Nagoya, JP;

Kei Sato, Tokai, JP;

Tsutomu Nanataki, Toyoake, JP;

Assignee:

NGK Insulators, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C04B 35/115 (2006.01); G02B 1/00 (2006.01); C01F 7/02 (2006.01); C01F 7/30 (2006.01); C04B 35/63 (2006.01); C04B 35/632 (2006.01); C04B 35/634 (2006.01); C04B 35/638 (2006.01); C04B 35/645 (2006.01); C30B 1/04 (2006.01); C30B 1/10 (2006.01); C30B 29/20 (2006.01); C01F 7/44 (2006.01); C04B 35/626 (2006.01); H01L 33/28 (2010.01); H01L 33/32 (2010.01);
U.S. Cl.
CPC ...
C04B 35/115 (2013.01); C01F 7/02 (2013.01); C01F 7/30 (2013.01); C01F 7/441 (2013.01); C01F 7/442 (2013.01); C04B 35/6268 (2013.01); C04B 35/632 (2013.01); C04B 35/6303 (2013.01); C04B 35/638 (2013.01); C04B 35/6342 (2013.01); C04B 35/645 (2013.01); C04B 35/6455 (2013.01); C30B 1/04 (2013.01); C30B 1/10 (2013.01); C30B 29/20 (2013.01); G02B 1/00 (2013.01); C01P 2002/72 (2013.01); C01P 2004/20 (2013.01); C01P 2004/54 (2013.01); C01P 2004/61 (2013.01); C01P 2006/80 (2013.01); C04B 2235/322 (2013.01); C04B 2235/3206 (2013.01); C04B 2235/3208 (2013.01); C04B 2235/3217 (2013.01); C04B 2235/3418 (2013.01); C04B 2235/425 (2013.01); C04B 2235/445 (2013.01); C04B 2235/5292 (2013.01); C04B 2235/5296 (2013.01); C04B 2235/5436 (2013.01); C04B 2235/5445 (2013.01); C04B 2235/604 (2013.01); C04B 2235/6025 (2013.01); C04B 2235/612 (2013.01); C04B 2235/656 (2013.01); C04B 2235/6567 (2013.01); C04B 2235/72 (2013.01); C04B 2235/721 (2013.01); C04B 2235/725 (2013.01); C04B 2235/77 (2013.01); C04B 2235/787 (2013.01); C04B 2235/9653 (2013.01); C04B 2235/9692 (2013.01); H01L 33/28 (2013.01); H01L 33/32 (2013.01);
Abstract

An alumina sintered body according to the present invention has a degree of c-plane orientation of 90% or more as determined by Lotgering's method from an X-ray diffraction profile obtained by irradiating a plate surface with X-rays in a range of 2θ=20° to 70°. The alumina sintered body has no pores when a cross-sectional surface formed in a direction perpendicular to the plate surface is polished using an Arion beam and a mask and is examined under a scanning electron microscope at a magnification of 5,000 times. The alumina sintered body has a total mass fraction of impurity elements other than Mg and C of 100 ppm or less. This alumina sintered body has a high degree of orientation, high density, and high purity and thus has a higher optical translucency than those known in the art.


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