The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Mar. 23, 2016
Applicants:

Oliver Baruth, Erlangen, DE;

Philipp Bernhardt, Forchheim, DE;

Richard Obler, Erlangen, DE;

Inventors:

Oliver Baruth, Erlangen, DE;

Philipp Bernhardt, Forchheim, DE;

Richard Obler, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5235 (2013.01); A61B 6/5258 (2013.01); G06T 5/003 (2013.01); G06T 5/50 (2013.01); A61B 6/4441 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A method and apparatus for determining an x-ray image data record of a target location subjected to a movement using an x-ray device. A number of basic images of the target location are recorded using a basic exposure time in each case and the x-ray image data record corresponding to an x-ray image with a longer exposure time is determined by combining basic images registered with one another. At least one quality value assigned hereto and relating to the movement in the target location during the recording is determined for each basic image and the contribution of a basic image to the x-ray image data record is determined as a function of the quality value.


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