The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Feb. 14, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takashi Sudo, Inagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/12 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/14 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/12 (2013.01); A61B 3/005 (2013.01); A61B 3/0025 (2013.01); A61B 3/0091 (2013.01); A61B 3/1005 (2013.01); A61B 3/1015 (2013.01); A61B 3/14 (2013.01); G02B 27/0068 (2013.01);
Abstract

A fundus imaging apparatus according to embodiments of the present invention includes an optical unit configured to guide light from a fiber light source to a fundus of a subject eye, a wavefront sensor capable of measuring the wavefront of reflected light guided via the optical unit after the light from the fiber light source is reflected on the fundus, a wavefront correction device provided on an optical path extending between the fiber light source and the subject eye to correct the wavefront of the reflected light, an APD that can receive the reflected light and capture an image of the fundus, and a processing and control unit configured to acquire thickness information about an optical diffusive layer of the fundus and determine a correction value to be used when the wavefront correction device corrects the wavefront of the reflected light based on the acquired thickness information.


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