The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Dec. 05, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hideaki Sambonsugi, Tokyo, JP;

Toshiyuki Okubo, Machida, JP;

Assignee:
Attorney:
Int. Cl.
CPC ...
H04N 5/367 (2011.01); H04N 5/232 (2006.01); H04N 5/341 (2011.01);
U.S. Cl.
CPC ...
H04N 5/367 (2013.01); H04N 5/23212 (2013.01); H04N 5/341 (2013.01);
Abstract

An image pickup apparatus enabling reduction of information amount of defective pixels of an image pickup device having pixels pupil-dividing light through a photographic optical system. Each pixel is provided with PD portions for one micro lens for pupil-division of the light. First image data is generated by adding all signals from the PD portions, and second image data is generated by a signal output from one PD portion or by adding signals from part of PD portions. First defect information indicates defect information of the first image data, and second defect information is formed by excluding information redundant with the first defect information from defect information of the second image data. Defective pixels included in the second image data are designated based on the first defect information and the second defect information. The second image data is corrected by correcting the designated defective pixels.


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