The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Sep. 18, 2015
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Aanchal Gupta, Mountain View, CA (US);

Kiran Kumar Muniswamy Reddy, Sammamish, WA (US);

Shirley Xue Yi Ly, Bellevue, WA (US);

Lokendra Singh Panwar, Seattle, WA (US);

Pejus Manoj Das, Shoreline, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
H04L 43/06 (2013.01); G06F 17/30321 (2013.01); G06F 17/30584 (2013.01); H04L 43/0888 (2013.01);
Abstract

A data storage system may implement generating creation performance metrics for a secondary index of a table. Metrics may be collected from different partitions of a table and different partitions of a secondary index in a table store upon initiating creation of the secondary index for the table that utilize provisioned resources for creating the secondary index. The metrics may be analyzed to generate performance metrics for the creation of the table. The performance metrics may be provided to clients of the data store or to monitoring systems. Monitoring systems may send performance event notifications to clients or automatically perform modifications to the provisioned throughput capacity.


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