The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Dec. 07, 2017
Applicant:

Qatar University, Al Tarfa, Doha, QA;

Inventors:

Mohamed Awadin, Plymouth Meeting, PA (US);

Ridha Hamila, Doha, QA;

Naofal Al-Dhahir, Richardson, TX (US);

Waheed U. Bajwa, Piscataway, NJ (US);

Assignee:

Qatar University, Al Tarfa Doha, QA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/17 (2015.01); G06F 17/14 (2006.01); H04B 7/0456 (2017.01); H01Q 21/08 (2006.01); H04B 7/0452 (2017.01);
U.S. Cl.
CPC ...
H04B 17/17 (2015.01); G06F 17/141 (2013.01); H01Q 21/08 (2013.01); H04B 7/0456 (2013.01); H04B 7/0452 (2013.01);
Abstract

The method of identifying faulty antenna elements in massive uniform linear antenna arrays is a compressive sensing-based method that takes advantage of the reduction of the measurement matrix for a uniform linear antenna array to a partial discrete Fourier transform (DTF) matrix, whose rows correspond to the measurements' locations. Particularly, the method of identifying faulty antenna elements in massive uniform linear antenna arrays allows the measurements to be taken to reduce the measurement matrix's worst-case coherence, a factor which affects the detection probability of the defective antenna elements. The method constructs a measurement matrix with fewer distinct inner product values to reduce the worst-case coherence. In an alternative embodiment, the method focuses on bounding the inner product between any pair of measurement matrix columns.


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