The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Jan. 05, 2016
Applicant:

SK Hynix Inc., Gyeonggi-do OT, KR;

Inventors:

Chung-Li Wang, Fremont, CA (US);

Lingqi Zeng, San Jose, CA (US);

Yi-Min Lin, San Jose, CA (US);

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); H03M 13/15 (2006.01); H03M 13/23 (2006.01); H03M 13/29 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1108 (2013.01); H03M 13/152 (2013.01); H03M 13/1515 (2013.01); H03M 13/23 (2013.01); H03M 13/2957 (2013.01); H03M 13/2963 (2013.01);
Abstract

A method for decoding low-density parity check (LDPC) codes, includes computing an initial syndrome of an initial output, obtaining an initial number of unsatisfied checks based on the computed initial syndrome, and when the initial number of unsatisfied checks is greater than zero, computing a reliability value with a parity check, performing a bit flip operation, computing a subsequent syndrome of a subsequent output, and ending decoding when a number of unsatisfied checks obtained based on the computed subsequent syndrome is equal to zero.


Find Patent Forward Citations

Loading…