The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Nov. 30, 2015
Applicant:

Osram Opto Semiconductors Gmbh, Regensburg, DE;

Inventors:

Bernd Barchmann, Regensburg, DE;

Fabian Eigenmann, Regensburg, DE;

Andreas Ploessl, Regensburg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/683 (2006.01); H01L 21/78 (2006.01); H01L 33/00 (2010.01); H01L 31/0224 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 33/0054 (2013.01); H01L 21/6836 (2013.01); H01L 21/78 (2013.01); H01L 24/94 (2013.01); H01L 31/022441 (2013.01); H01L 33/0091 (2013.01); H01L 24/03 (2013.01); H01L 24/32 (2013.01); H01L 24/83 (2013.01); H01L 2221/68327 (2013.01); H01L 2221/68336 (2013.01); H01L 2224/03002 (2013.01); H01L 2224/05669 (2013.01); H01L 2224/293 (2013.01); H01L 2224/2929 (2013.01); H01L 2224/29291 (2013.01); H01L 2224/29339 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/8384 (2013.01); H01L 2224/83469 (2013.01); H01L 2224/83801 (2013.01); H01L 2224/83851 (2013.01); H01L 2224/94 (2013.01); H01L 2924/15156 (2013.01);
Abstract

A method for producing a multiplicity of semiconductor chips () is provided, comprising the following steps: —providing a wafer () comprising a multiplicity of semiconductor bodies (), wherein separating lines () are arranged between the semiconductor bodies (), —depositing a contact layer () on the wafer (), wherein the material of the contact layer () is chosen from the following group: platinum, rhodium, palladium, gold, and the contact layer () has a thickness of between 8 nanometers and 250 nanometers, inclusive, —applying the wafer () to a film (), —at least partially severing the wafer () in the vertical direction along the separating lines () or introducing fracture nuclei () into the wafer () along the separating lines (), and —breaking the wafer () along the separating lines () or expanding the film () such that a spatial separation of the semiconductor chips () takes place, wherein the contact layer () is also separated. A semiconductor chip, a component and a method for producing the latter are also provided.


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