The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10134624 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 20, 2018

Filed:

Mar. 09, 2018
Applicant:

Doug Carson & Associates, Inc., Cushing, OK (US);

Inventors:

Douglas M. Carson, Cushing, OK (US);

Mike Chatterton, Stillwater, OK (US);

Stephen Houser, Stillwater, OK (US);

Bryan Whitfield, Stillwater, OK (US);

Assignee:

Doug Carson & Associates, Inc., Cushing, OK (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/68 (2006.01); H01L 23/544 (2006.01); H01L 21/67 (2006.01); H01J 37/20 (2006.01); H01J 37/30 (2006.01);
U.S. Cl.
CPC ...
H01L 21/681 (2013.01); H01J 37/20 (2013.01); H01J 37/3005 (2013.01); H01L 21/67282 (2013.01); H01L 23/544 (2013.01); H01J 2237/31754 (2013.01); H01L 2223/54426 (2013.01);
Abstract

Apparatus and method for aligning a rotatable substrate to a support mechanism to write a feature to the substrate, and a substrate so configured. In some embodiments, the substrate has a circumferentially extending timing pattern with spaced apart first and second timing marks disposed on opposing sides of a center point of the timing pattern and an identification (ID) field that stores a unique identifier value associated with the substrate. Upon mounting of the substrate to a support mechanism that rotates the substrate about a central axis that is offset from the center point, a control circuit generates a compensation value to compensate for the offset using the first and second timing marks and outputs a process instruction to authorize processing of the substrate using the unique identifier value. In some cases, the unique identifier value is used as a lookup to a computerized database.


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Carson, Douglas. (2018). Substrate alignment detection using circumferentially extending timing pattern (U.S. Patent No. 10134624). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10134624

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