The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
May. 17, 2017
Applicant:
SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;
Inventor:
Jae Il Kim, Yongin-si, KR;
Assignee:
SK hynix Inc., Icheon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01); G11C 5/14 (2006.01); G11C 7/22 (2006.01); G11C 8/10 (2006.01); G11C 7/10 (2006.01); G11C 29/02 (2006.01); G11C 19/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50008 (2013.01); G11C 5/147 (2013.01); G11C 7/1057 (2013.01); G11C 7/1084 (2013.01); G11C 7/222 (2013.01); G11C 8/10 (2013.01); G11C 29/022 (2013.01); G11C 29/025 (2013.01); G11C 29/028 (2013.01); G11C 19/00 (2013.01); G11C 2207/2272 (2013.01);
Abstract
A semiconductor system may be provided. The semiconductor system may include a first semiconductor device, a second semiconductor device, and a third semiconductor device. The first semiconductor device outputs address signals. The first semiconductor device may receive or output data. The second semiconductor device may perform an impedance calibration operation and outputs pull-up codes and pull-down codes generated by the impedance calibration operation. The third semiconductor device may output internal data selected by the address signals as the data or store the data during a write operation or a read operation.