The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Jul. 24, 2015
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventors:

Myung Kyun Kwak, Yongin-si, KR;

Bok Rim Ko, Seoul, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/46 (2006.01); G11C 29/00 (2006.01); G11C 29/12 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G11C 29/46 (2013.01); G01R 31/31701 (2013.01); G11C 29/006 (2013.01); G11C 29/12 (2013.01); G11C 29/12015 (2013.01);
Abstract

A semiconductor system includes a controller and a semiconductor device. The controller outputs a burn-in test signal, a clock signal and command/address signals. The semiconductor device enters a first test mode if the burn-in test signal is inputted. The semiconductor device enters a second test mode according to a level combination of the command/address signals in synchronization with the clock signal after the semiconductor device enters the first test mode. The semiconductor device enters a third test mode according to an other level combination of the command/address signals in synchronization with the clock signal after the semiconductor device enters the second test mode.


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