The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Mar. 27, 2015
Smiths Heimann Sas, Vitry-sur-Seine, FR;
Najib Gadi, Vitry-sur-Seine, FR;
SMITHS HEIMANN SAS, Vitry-sur-Seine, FR;
Abstract
In one embodiment, the disclosure relates to a method for inspecting a load () in a container (), comprising: classifying (S) one or more patches () of a digitized inspection image (), the digitized inspection image () being generated by an inspection system () configured to inspect the container () by transmission of inspection radiation () from an inspection radiation source () to an inspection radiation detector () through the container (), wherein the classifying (S) comprises: extracting (S) one or more texture descriptors (V, P) of a patch (), and classifying (S) the patch (), by comparing the one or more extracted texture descriptors (V, P) of the patch () to respective one or more reference texture descriptors (Vr, Wr, Pr) corresponding to respective one or more classes () of reference items (), the one or more reference texture descriptors (Vr, Wr, Pr) of each class of reference items () being extracted from one or more reference images () of the one or more reference items ().