The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Jun. 09, 2017
Cytognos, S.l., Salamanca, ES;
Rafael Fluxá Rodriguez, Salamanca, ES;
José Alberto Orfao de Matos Correia E Vale, Salamanca, ES;
Juan Bernardo Hernández Herrero, Salamanca, ES;
Cytognos, S.L., Salamanca, ES;
Universidad de Salamanca, Salamanca, ES;
Abstract
The invention relates to a computer-implemented method for classifying events present in a sample, wherein each event is characterized by a multidimensional set of parameters obtained by means of hardware and/or software, wherein the values of the parameters associated with each event define the position coordinates of said event in a multidimensional space. Said method comprises the following stages: a) clustering the events in groups, b) checking if within each formed group there is a connection between events exceeding a maximum distance threshold, c) calculating the affinity between each pair of previously generated sample groups, d) comparing each sample group with at least one reference group stored in at least one database, e) classifying the sample groups based on the comparisons with the reference groups.