The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Nov. 28, 2012
Roche Molecular Systems, Inc., Pleasanton, CA (US);
Aditya P. Sane, Pleasanton, CA (US);
Ronald T. Kurnik, Foster City, CA (US);
Jonathan M. Baldanza, Castro Valley, CA (US);
Roche Molecular Systems, Inc., Pleasanton, CA (US);
Abstract
Systems and methods for removing jump discontinuities in growth data are provided. A first approximation to a received data set is determined by applying a non-linear regression process to a non-linear function that models the data set to determine parameters, including a step discontinuity parameter. A second approximation to the data set is also determined by applying a regression process to a second non-linear function to determine parameters, including a step discontinuity parameter, of the second function. One of the approximations is selected based on an information coefficient determined for each of the approximations. If a confidence interval for the step discontinuity parameter includes zero, no correction is made, and if includes zero, then a correction is made. For a correction, the portion of the data curve prior to the step change is replaced with appropriate portion of the selected approximation to produce a shift-corrected data set.