The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Feb. 23, 2016
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Hiroaki Yoshida, Cupertino, CA (US);

Ripon Kumar Saha, Austin, TX (US);

Mukul R. Prasad, San Jose, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 17/3053 (2013.01); G06F 11/362 (2013.01); G06F 11/3664 (2013.01); G06F 2201/86 (2013.01); G06F 2201/865 (2013.01); G06F 2201/88 (2013.01);
Abstract

According to an aspect of an embodiment, a method may include identifying a fault at a fault location in a software program using a test suite. The method may also include determining multiple textual similarity scores by determining a textual similarity score with respect to each of multiple repair candidates for the fault. In addition, the method may include sorting the repair candidates based on the textual similarity scores. The method may also include selecting a particular repair candidate from the repair candidates based on the sorting. Moreover, the method may include implementing the particular repair candidate at the fault location based on the selection of the particular repair candidate.


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