The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Aug. 07, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

David J. Agans, Wilton, NH (US);

David W. Harvey, Newton Center, MA (US);

Gregory S. Schaffer, Berlin, MA (US);

Mark J. Cariddi, Merrimack, NH (US);

Long Zhang, Beijing, CN;

Henry Austin Spang, IV, Hopkinton, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0611 (2013.01); G06F 3/0683 (2013.01);
Abstract

A method, computer program product, and computing system for determining a queue depth and a flush rate for each of a plurality of pending data queues associated with a cache system, thus defining a queue depth/flush rate pair for each of the plurality of pending data queues. A predicted drain time is determined for each of the plurality of pending data queues based, at least in part, upon the queue depth/flush rate pair, thus defining a plurality of predicted drain times that are respectively associated with the plurality of pending data queues.


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