The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Dec. 30, 2011
Peter W. Evans, Mountain House, CA (US);
Scott Corzine, Sunnyvale, CA (US);
Mehrdad Ziari, Pleasanton, CA (US);
Pavel V. Studenkov, Cupertino, CA (US);
Masaki Kato, Palo Alto, CA (US);
Charles H. Joyner, Haleiwa, HI (US);
Peter W. Evans, Mountain House, CA (US);
Scott Corzine, Sunnyvale, CA (US);
Mehrdad Ziari, Pleasanton, CA (US);
Pavel V. Studenkov, Cupertino, CA (US);
Masaki Kato, Palo Alto, CA (US);
Charles H. Joyner, Haleiwa, HI (US);
Infinera Corporation, Sunnyvale, CA (US);
Abstract
Consistent with the present disclosure, both arms of an MZ interferometer are 'double-folded' and are bent in at least two locations to define first and second acute inner angles. Accordingly, the arms of the MZ interferometer may have substantially the same length, and, further, the MZ interferometer has a more compact geometry. In one example, the arms parallel each other and have a serpentine shape, and, in a further embodiment, the arms parallel one another and have a Z-shape. Accordingly, since the temperature of a PIC upon which the MZ interferometer is provided does not vary significantly over such short distances, the temperatures of both arms is substantially the same.