The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Jul. 14, 2016
Applicant:
Schlumberger Technology Corporation, Sugar Land, TX (US);
Inventors:
Yuehua Chen, Machida, JP;
Cong Wang, Sagamihara, JP;
Assignee:
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 8/00 (2006.01); G01N 21/25 (2006.01); G01N 21/27 (2006.01); G01N 21/3577 (2014.01);
U.S. Cl.
CPC ...
G01V 8/00 (2013.01); G01N 21/25 (2013.01); G01N 21/274 (2013.01); G01N 21/3577 (2013.01);
Abstract
A technique includes acquiring dry condition and wet measurements using an optical spectrometer for a plurality of lamp intensities. The technique includes determining candidate maximum optical densities as a function of the lamp intensities based at least in part on a reference measurement that is acquired by the spectrometer, the reference measurement and does not vary with respect to the lamp intensities. The technique includes determining an optical density linear dynamic range based at least in part on the candidate maximum optical densities.