The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Apr. 08, 2016
Applicants:

The University of Chicago, Chicago, IL (US);

Brookhaven Science Associates, Llc, Upton, NY (US);

Inventors:

Henry J. Frisch, Chicago, IL (US);

Eric J. Oberla, Chicago, IL (US);

Hee-Jong Kim, Naperville, IL (US);

Minfang Yeh, Stony Brook, NY (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/29 (2006.01); G01T 1/20 (2006.01); G01T 1/204 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01); G01T 1/204 (2013.01); A61B 6/037 (2013.01); G01T 1/2018 (2013.01);
Abstract

TOF-PET detector systems, and methods for imaging photon-emitting samples using the detector systems, are provided. The TOF-PET detector systems use large-area photodetectors with extremely high time-resolution and an approach to data collection and analysis that allows for the use of inexpensive low-density scintillator materials. The TOF-PET detector systems are characterized by their ability to identify, on a statistical basis, the transverse and depth location of the first of the series of energy deposition events that are generated when a gamma photon enters the low-density scintillator material.


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