Alpha particle detection apparatus using dual probe structured ionization chamber and differential amplifier

Abstract

Disclosed in an alpha particle detection apparatus using a dual probe structured ionization chamber and a differential amplifier, the apparatus including: an ionization chamber forming electric field thereinside by bias power applied to a surface thereof; a main probe unit absorbing ionic charges generated in an occurrence of alpha (α) decay in the ionization chamber; a guard ring unit absorbing leakage current generated between the ionization chamber and the main probe unit and flowing the leakage current to a ground; an auxiliary probe allowing surrounding noise to be introduced therein; first and second preamplifiers amplifying fine electrical signals to a predetermined magnitude; and a differential canceling a noise signal and outputting an alpha particle detection signal by amplifying a voltage difference between the preamplified electrical signals. As such, it is possible to effectively detect alpha (α) particles which are a type of radiation.