The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Feb. 02, 2016
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Venkatesan Nallampatti Ekambaram, Somerville, NJ (US);

Jubin Jose, Belle Mead, NJ (US);

Urs Niesen, Summit, NJ (US);

Xinzhou Wu, Hillsborough, NJ (US);

Lionel Jacques Garin, Palo Alto, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/53 (2010.01); G01C 21/16 (2006.01); G01S 19/42 (2010.01); G01S 19/52 (2010.01); G01S 11/12 (2006.01); G01S 19/47 (2010.01); G01S 5/16 (2006.01);
U.S. Cl.
CPC ...
G01S 19/53 (2013.01); G01C 21/165 (2013.01); G01S 11/12 (2013.01); G01S 19/42 (2013.01); G01S 19/52 (2013.01); G01S 5/163 (2013.01); G01S 19/47 (2013.01);
Abstract

A method for aligning visual-inertial odometry (VIO) and satellite positioning system (SPS) reference frames includes obtaining a plurality of range-rate measurements of a mobile platform from an SPS. The range-rate measurements are with respect to a global reference frame of the SPS. The method also includes obtaining a plurality of VIO velocity measurements of the mobile platform from a VIO system. The VIO velocity measurements are with respect to a local reference frame of the VIO system. At least one orientation parameter is then determined to align the local reference frame with the global reference frame based on the range-rate measurements and the VIO velocity measurements.


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