The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Jun. 24, 2013
Hitachi, Ltd., Tokyo, JP;
Ryota Sato, Tokyo, JP;
Toru Shirai, Tokyo, JP;
Yo Taniguchi, Tokyo, JP;
Yoshihisa Soutome, Tokyo, JP;
Yoshitaka Bito, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A magnetic resonance imaging apparatus comprising a measurement parameter-setting unit for setting measurement parameters that determine the strength and timing of the high frequency magnetic field and the gradient magnetic field, and a measuring unit for applying the high frequency magnetic field and the gradient magnetic field on a subject placed in the static magnetic field according to the measurement parameters and detecting the nuclear magnetic resonance signal generated from the subject as a complex signal. The measurement parameter-setting unit is equipped with: a basic parameter-inputting section for setting the imaging parameters and imaging cross-section; a limiting condition-inputting section for setting limiting conditions that apply limits on the setting of the voxel size; a voxel size-calculating section for setting the voxel size according to the limiting conditions; and a voxel size-displaying section for displaying the set voxel size to the user.