The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Apr. 24, 2014
Applicant:

GE Medical Systems Global Technology Company, Llc, Waukesha, WI (US);

Inventors:

Yoshihiro Tomoda, Hino, JP;

Marie Uno, Taito-ku, JP;

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); A61B 5/055 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/543 (2013.01); A61B 5/055 (2013.01); G01R 33/5608 (2013.01); G01R 33/546 (2013.01);
Abstract

A scan condition determining apparatus determines scan conditions in a magnetic resonance imaging system. The scan condition determining apparatus includes: a setting unit for setting an imaging range, a desired spatial resolution and a desired SN ratio; and a determining unit for determining a matrix number in a frequency encode direction and a matrix number in a phase encode direction, based on the imaging range and the desired spatial resolution set by the setting unit and determining physical parameters different from the matrix number in a frequency encode direction and a matrix number in a phase encode direction, based on the determined matrix numbers, the set imaging range and the set desired SN ratio.


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