The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Jun. 01, 2016
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Seon-kyoo Lee, Hwaseong-si, KR;
Jeong-don Ihm, Seongnam-si, KR;
Byung-hoon Jeong, Hwaseong-si, KR;
Dae-woon Kang, Suwon-si, KR;
Tae-sung Lee, Hwaseong-si, KR;
Sang-lok Kim, Seoul, KR;
Abstract
A semiconductor chip, a test system, and a method of testing the semiconductor chip. The semiconductor chip includes a pulse generator configured to generate a test pulse in response to a test request; a logic chain comprising a plurality of logic devices serially connected to each other and transferring the test pulse sequentially; and a detector configured to detect a logic level of an output signal of each of the logic devices and output a detection result indicating a degree of an inter-symbol interference (ISI).