The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Jun. 18, 2014
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Tony Vanhoucke, Bierbeek, BE;

Viet Nguyen, Leuven, BE;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 19/00 (2006.01); G06F 21/73 (2013.01); G09C 1/00 (2006.01); H04L 9/08 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2836 (2013.01); G01R 19/0092 (2013.01); G06F 21/73 (2013.01); G09C 1/00 (2013.01); G06F 2221/2103 (2013.01); H04L 9/0866 (2013.01); H04L 9/3278 (2013.01); H04L 2209/805 (2013.01);
Abstract

A method of identifying a component by a response to a challenge is disclosed, the component comprising an array of bipolar transistors connectable in parallel so as to have a common collector contact, a common emitter contact and a common base contact, the challenge comprising a value representative of a total collector current value, the method comprising: receiving the challenge; supplying the total collector current to the common collector contact; detecting instability in each of a group of the transistors; and determining the response in dependence on the group. A circuit configured to operate such a method is also disclosed.


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