The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Oct. 27, 2014
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Georg Kurz, Penzberg, DE;
Eloisa Lopez-Calle, Ludwigshafen, DE;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Abstract
A method for determining the amount of specific analyte of a sample which may show interferences by photometric assays, wherein the analyte is quantified from the change in the optical signal of the reaction mixture after the interaction of the analyte with analyte specific reagents. Multiple calibration curves are generated for multiple wavelengths for the specific analyte. An interference test is performed simultaneously to the determination of the specific analyte, for quantifying the amount of interfering substances present in the sample. The amount of each interfering substances is compared to predetermined cut-off values. The optical signal for the specific analyte is measured in the reaction mixture at multiple wavelengths over the complete reaction time, and a calibration curve is selected depending on the interfering substances. The amount of specific analyte is quantified by comparison with the selected calibration curve for the chosen wavelengths.