The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Jul. 10, 2017
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Enrico Bovero, Dhahran, SA;

Vincent Brian Cunningham, Abqaiq, SA;

Ilham Mokhtari, Dhahran, SA;

Aziz Fihri, Dhahran, SA;

Remi Mahfouz, Thuwal, SA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G02B 27/42 (2006.01); G02B 5/18 (2006.01); G01N 21/47 (2006.01); G01L 1/00 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01B 11/165 (2013.01); G01L 1/00 (2013.01); G01N 21/4788 (2013.01); G02B 5/1861 (2013.01); G02B 27/4244 (2013.01); G01N 2201/0635 (2013.01);
Abstract

Systems and methods are disclosed relating to composite photonic materials used to design structures and detecting material deformation for the purpose of monitoring structural health of physical structures. According to one aspect, a composite structure is provided that includes a base material, an optical diffraction grating and one or more fluorophore materials constructed such that localized perturbations create a measurable change in the structure's diffraction pattern. An inspection device is also provided that is configured to detect perturbations in the composite structure. The inspection device is configured to emit an inspecting radiation into the structure and capture the refracted radiation and measure the change in the diffraction pattern and quantify the perturbation based on the wavelength and the angular information for the diffracted radiation.


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