The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Sep. 20, 2016
Applicant:

J.a. Woollam Co., Inc, Lincoln, NE (US);

Inventors:

Jeremy A. Van Derslice, Lincoln, NE (US);

Martin M. Liphardt, Lincoln, NE (US);

Assignee:

J.A. WOOLAM CO., INC., Lincoln, NE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01J 4/04 (2006.01); G01J 3/18 (2006.01); G01J 3/14 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01J 1/42 (2013.01); G01J 3/14 (2013.01); G01J 3/18 (2013.01); G01J 4/04 (2013.01);
Abstract

Reflectometer, spectrophotometer, ellipsometer, and polarimeter systems having a supercontinuum laser source of coherent electromagnetic radiation over a range of about 400-about 2500 nm, a stage for supporting a sample and a detector of electromagnetic radiation, wherein the supercontinuum source provides a coherent beam of electromagnetic radiation which interacts with a sample, and the detector system comprises functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics, directs wavelengths in various ranges to various detectors that are well suited to detect them.


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