The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Feb. 28, 2012
Yoshihito Fujita, Tokyo, JP;
Mikio Nakamura, Tokyo, JP;
Hirofumi Ienaga, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A normal detection method for measuring the distance to a measurement subject using one or a plurality of distance detectors, and obtaining a normal vector on the measured surface of the measurement subject from the obtained measurement result, wherein: within a three-dimensional space, the straight line linking a first measurement point measured at a first measurement position using a distance detector and a second measurement point measured at a second measurement position different from the first measurement position is set as a first vector; the straight line linking the first measurement point and a third measurement point measured at a third measurement position different from the first measurement position and the second measurement position as a second vector; and a normal vector on the measured surface is obtained by determining the vector product of the first vector and the second vector.